Atomic layer deposition of III-V compounds to form V-NAND devices

ABSTRACT

A method for forming a V-NAND device is disclosed. Specifically, the method involves deposition of at least one of semiconductive material, conductive material, or dielectric material to form a channel for the V-NAND device. In addition, the method may involve a pretreatment step where ALD, CVD, or other cyclical deposition processes may be used to improve adhesion of the material in the channel.

CROSS REFERENCE TO RELATED APPLICATION

This application claims the benefit and priority of Provisional Application No. 62/272,345, filed on Dec. 29, 2015, entitled ATOMIC LAYER DEPOSITION OF III-V COMPOUNDS TO FORM V-NAND DEVICES, the contents of which are hereby incorporated by reference to the extent the contents do not conflict with the present disclosure.

FIELD OF INVENTION

The current invention is in the field of semiconductor manufacturing. Specifically, embodiments of the current invention relate to the formation of Vertical Not-AND (V-NAND) gate devices through atomic layer deposition (ALD), chemical vapor deposition (CVD), or interfacial pretreatment before semiconductor material deposition.

BACKGROUND OF THE DISCLOSURE

V-NAND devices are logic gates that can be built in a vertical three-dimensional structure for applications such as flash memory, for example. V-NAND devices include a channel used to conduct a signal. Currently, the channel is generally made of a poly-silicon layer, often deposited by low pressure chemical vapor deposition (LPCVD).

The channel may be formed in a narrow, deep cylindrical opening, approximately 80 nm wide and 2 μm deep. The channel itself may be approximately 10 nm thick. The remainder of the cylindrical opening may be filled with Silicon Dioxide (SiO₂) in what may be considered a “macaroni” structure.

Conductivity of the poly-silicon channel may depend on the length and width of the channel. As V-NAND devices become further scaled to be smaller, the channel becomes longer in length and narrower in width. As a result, a current passing through the channel decreases, leading to a reduction in speed of the V-NAND device. In addition, other factors potentially affecting the conductivity of the poly-silicon channel include the intrinsic mobility of electrons in silicon and the resistance induced by the grain boundaries in poly-silicon.

The conductivity of the channel is critical as it can directly affect the read and write speed of the V-NAND device in memory devices. The conductivity is critical due to the structure of memory devices. Currently, memory cells are formed by a poly-silicon channel on top of a tunnel dielectric, a trapping material, a blocking oxide, and a control gate. This is essentially the channel of many transistors piled on top of each other vertically. A finished vertical channel may consist of a string of transistors, for example, 32 or more transistors. Therefore, with the potential of many transistors strung vertically, the conductivity of the channel or speed will become increasingly crucial.

In typical logical devices, a single crystalline channel material is preferred. However, no viable way to fabricate a single crystalline channel in a V-NAND channel currently exists. For example, a bottom-up selective epitaxial growth may take a very long time and be very expensive to manufacture. For these reasons, a conformal LPCVD poly-silicon layer is currently used for forming V-NAND devices. As a result, a method for forming a stable channel material for use in V-NAND devices with the requisite conductivity is desired.

SUMMARY OF THE DISCLOSURE

In accordance with one embodiment of the invention, a method of forming a channel for use in a V-NAND device is disclosed, the method comprising: providing a substrate, the substrate having an opening; depositing a semiconducting material by atomic layer deposition in the opening to form a channel layer; and filling a remaining portion of the opening with a dielectric material.

In accordance with one embodiment of the invention, a method for forming a structure is disclosed, the method comprising: providing a substrate having a surface comprising an oxide; performing a pretreatment to the oxide surface; and depositing a semiconductor material on the oxide surface after the pretreatment; wherein the pretreatment comprises a gallium compound and oxygen compound.

In accordance with one embodiment of the invention, a method of forming a channel for use in a V-NAND device is disclosed, the method comprising: providing a substrate, the substrate having an opening; pretreating a surface formed in the opening; depositing a semiconductor material by atomic layer deposition inside the opening to form a channel layer; and filling a remaining portion of the opening with a dielectric material.

In accordance with one embodiment of the invention, a method of forming a channel for use in a V-NAND device is disclosed, the method comprising: providing a substrate, the substrate having an opening; depositing a first semiconductor material by atomic layer deposition in the opening to form a channel layer; and filling a remaining portion of the opening with a second semiconductor material.

In accordance with one embodiment of the invention, a method of forming a channel for use in a V-NAND device is disclosed, the method comprising: providing a substrate, the substrate having a cylindrical opening; pretreating surfaces formed in the cylindrical opening; depositing a first III-V material inside the cylindrical opening by atomic layer deposition to form a channel layer; and filling a remaining portion of the cylindrical opening with a second semiconductor material.

In accordance with one embodiment of the invention, a method of performing pretreatment prior to depositing a channel for use in a V-NAND device is disclosed, the method comprising: performing a cyclic pretreatment process comprising pulse of a first metal reactant and a pulse of non-metal reactant; and performing a second pulse comprising a second metal reactant within an opening in which a channel is to be deposited; wherein the cyclic pretreatment process improves adhesion of a material to be deposited in the opening.

For purposes of summarizing the invention and the advantages achieved over the prior art, certain objects and advantages of the invention have been described herein above. Of course, it is to be understood that not necessarily all such objects or advantages may be achieved in accordance with any particular embodiment of the invention. Thus, for example, those skilled in the art will recognize that the invention may be embodied or carried out in a manner that achieves or optimizes one advantage or group of advantages as taught or suggested herein without necessarily achieving other objects or advantages as may be taught or suggested herein.

All of these embodiments are intended to be within the scope of the invention herein disclosed. These and other embodiments will become readily apparent to those skilled in the art from the following detailed description of certain embodiments having reference to the attached figures, the invention not being limited to any particular embodiment(s) disclosed.

BRIEF DESCRIPTION OF THE DRAWING FIGURES

These and other features, aspects, and advantages of the invention disclosed herein are described below with reference to the drawings of certain embodiments, which are intended to illustrate and not to limit the invention.

FIG. 1 is a flowchart of a method in accordance with at least one embodiment of the invention.

FIG. 2 is a flowchart of a method in accordance with at least one embodiment of the invention.

FIG. 3 is a flowchart of a method in accordance with at least one embodiment of the invention.

FIG. 4 is a flowchart of a method in accordance with at least one embodiment of the invention.

FIG. 5 is a flowchart of a method in accordance with at least one embodiment of the invention.

FIG. 6 illustrates a structure in accordance with at least on embodiment of the disclosure.

It will be appreciated that elements in the figures are illustrated for simplicity and clarity and have not necessarily been drawn to scale. For example, the dimensions of some of the elements in the figures may be exaggerated relative to other elements to help improve understanding of illustrated embodiments of the present disclosure.

DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS

Although certain embodiments and examples are disclosed below, it will be understood by those in the art that the invention extends beyond the specifically disclosed embodiments and/or uses of the invention and obvious modifications and equivalents thereof. Thus, it is intended that the scope of the invention disclosed should not be limited by the particular disclosed embodiments described below.

Embodiments of the invention relate to methods of manufacturing or treating a V-NAND device. Specifically, the methods include manufacturing a channel material or treating the channel material in order to allow for optimum performance and stability. Embodiments of the invention may take place in in batch, mini-batch, or single-wafer reactors.

FIG. 1 illustrates one method in accordance with the invention. The method includes a step of providing a substrate 100. The substrate of the providing step 100 has an opening that may be formed by etching, for example. The opening of the substrate as seen from the top of the substrate in a birds-eye view may have a shape that is circular, square, rectangular, or other shape. The opening of the substrate may then extend into the substrate, resulting in a three-dimensional shape, such as a cylindrical, cuboidal, via-shaped, tapered three-dimensional shape, or other shape. After the providing step 100, additional steps to form or deposit further layers (i.e., the tunnel dielectric, a trapping material and/or a blocking oxide) are performed.

The method includes a step of depositing a first material to form a channel layer 110. The first material may be a compound semiconductor material. Appropriate compound semiconductor materials may include III-V materials, II-VI materials, and IV-VI materials. The depositing step 110 may be accomplished by atomic layer deposition (ALD), chemical vapor deposition (CVD), or other cyclical deposition processes, resulting in a layer for the channel layer, which is poly-crystalline in some embodiments. ALD may provide the advantage of a highly conformal deposition in high aspect ratio structures, similar to those in V-NAND applications. The III-V materials that may be used in the depositing step 110 include: gallium arsenide (GaAs); gallium antimonide (GaSb); indium phosphide (InP); gallium nitride (GaN); indium antimonide (InSb); indium gallium arsenide (InGaAs); or a combination of aluminum, gallium, or indium with nitride, phosphide, arsenide, or antimony. In some embodiments, the III-V material may be deposited by an ALD process comprising alkylsilyl-compounds of As or Sb and/or halides, such as chlorides, of the group 13 elements, like Al, Ga and In. The II-VI material that may be used in the depositing step 110 include: zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telluride (ZnTe), cadmium sulfide (CdS), cadmium telluride (CdTe), and cadmium selenide (CdSe). The IV-VI material that may be used in the depositing step 110 include: tin sulfide (SnS), silicon selenide (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon telluride (SiTe), germanium telluride (GeTe), and tin telluride (SnTe).

Other materials that can potentially be deposited through atomic layer deposition in the depositing step 110 may include semiconducting materials, such as germanium (Ge), silicon germanium (SiGe), germanium selenide (GeSe), zinc oxide (ZnO), zinc oxynitride (ZnON), indium gallium zinc oxide (IZGO), indium tin oxide (ITO), titanium oxide (TiOx), tin selenide (SnSe), carbon nanotubes, graphene, silicon carbide (SiC), germanium tin (GeSn), diamond, tungsten sulfide (WS₂), or boron nitride carbide (BNC). The applicability of these above listed materials will depend on the availability of forming processes as well as sufficiently high intrinsic mobility.

The channel layer formed in depositing step 110 may be approximately 10 nm thick. The method also includes a step of filling a remaining opening with a second material 120. Materials that may be used in the filling step 120 include silicon oxides (such as silicon dioxide, hafnium oxides, or aluminum oxides), polysilicon, or other conductive materials. Each of the steps discussed above may be repeated and ordered in different sequences in order to allow formation of a desired channel.

FIG. 2 illustrates one method in accordance with the invention. The method includes a step of providing a substrate 200. The substrate of the providing step 200 has an opening that may be formed by etching, for example. The opening of the substrate as seen from the top of the substrate in a birds-eye view may have a shape that is circular, square, rectangular, or other shape. The opening of the substrate may then extend into the substrate, resulting in a three-dimensional shape, such as a cylindrical, cuboidal, via-shaped, tapered three-dimensional shape, or other shape. After the providing step 200, additional steps to form or deposit further layers (i.e., the tunnel dielectric, a trapping material and/or a blocking oxide) are performed.

The method includes a step of pretreatment, such as cyclic pretreatment, to improve adhesion 210. The step of pretreating 210 may be employed to assist the adhesion of ALD grown compound semiconductor film, such as III-V material, on a surface. In other embodiments, CVD or other cyclical deposition processes may be used. For example, the surface may comprise dielectric material, such as silicon oxide based dielectrics used as a tunnel oxide in V-NAND structure, resulting in greater stability of the formed V-NAND device. The pretreating step 210 may include a first pulse of a combination of a metal reactant and a non-metal reactant. The pretreating step 210 may then include a second pulse of a metal reactant.

In one embodiment in accordance with the invention, the pretreating step 210 may include several pulses of GaCl₃ and H₂O before starting a deposition of III-V material, such as GaSb, onto a thermal SiO₂ substrate. The deposition may also take place on a high-k material as well. A pretreating step 210 may include a first pulse of gallium trichloride (GaCl₃) and water. A deposition step 220 may follow, comprising a second pulse of Sb(SiMe₃)₃ and GaCl₃. The first pulse or the second pulse may be repeated as necessary. Typical pulse lengths may range from about 0.05 to 20 seconds, from about 0.1 to 5 seconds, or from about 0.2 to 2 seconds. However, other pulse lengths may be utilized if necessary, such as where highly conformal step coverage over extremely high aspect ratio structures or structures having high surface area or other structures with complex surface morphology is needed or in case of batch reactors. Similarly, typical removal/purge times are from about 0.05 to 20 seconds, from about 0.5 to 10 seconds, or from about 1 to 5 seconds. However, other removal/purge times may be utilized if necessary, such as where highly conformal step coverage over extremely high aspect ratio structures or structures having high surface area or other structures with complex surface morphology is needed or in case of batch reactors.

Substrate Pulsing Scheme Test 20 nm thermal SiO₂ 1*[GaCl₃ and H₂O] and Heavy partial 100*[Sb(SiMe₃)₃ delamination and GaCl₃] 20 nm thermal SiO₂ 2*[GaCl₃ and H₂O] and Partial 100*[Sb(SiMe₃)₃ delamination and GaCl₃] 20 nm thermal SiO₂ 3*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 4*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 5*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 6*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 7*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 8*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 9*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 10*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃]

Chemicals that may be used as a metal reactant for the first pulse of the pretreating step 210 include metal compounds. The metal compounds may include metal-organics or organometallic compounds, such as: metal-organic or organometallic compounds of group 13 or group 15 elements; metal-organic or organometallic compounds of gallium or antimony; or metal halides such as metal chlorides, semi-metal halides, semi-metal chlorides, gallium trichloride (GaCl₃), and other gallium halides. Chemicals that may be used as a non-metal reactant for the second pulse of the pretreating step 210 include oxygen-containing reactants, such as H₂O, H₂O₂, O₃, and plasmas and radicals incorporating oxygen. Other non-metal reactants may include chemicals with a hydroxide group and others. The first and second pulses of the pretreating step 210 may be performed in any order. In some embodiments, the pretreating step 210 may deposit a material, such as Ga₂O₃, onto the substrate. In some embodiments, the pretreating step 210 may not deposit a substantial amount or a film of material, such as Ga₂O3, onto the substrate. In some embodiments, the temperature of the pretreating step 210 is from about 20 to about 500° C., from about 40 to about 250° C., from about 50 to about 150° C., or from about 60 to about 130° C. In some embodiments, the temperature of the pretreating step 210 may be substantially the same as the temperature of the depositing step 220. In some embodiments, the temperature of the pretreating step 210 may be within less than a difference of about 100° C., within less than a difference of about 50° C., or within less than a difference of 20° C. from the temperature of the depositing step 220.

The method includes a step of depositing a first material to form a channel layer 220. The first material may comprise a compound semiconductor material. Appropriate compound semiconductor materials may include III-V materials, II-VI materials, and IV-VI materials. The depositing step 220 may be accomplished by atomic layer deposition (ALD), resulting in a layer for the channel layer, which in some embodiments is poly-crystalline. ALD may provide the advantage of a highly conformal deposition in high aspect ratio structures, similar to those in V-NAND applications. In other embodiments, CVD or other cyclical deposition processes may be used. The III-V materials that may be used in the depositing step 220 include: gallium arsenide (GaAs); gallium antimonide (GaSb); indium phosphide (InP); gallium nitride (GaN); indium antimonide (InSb); indium gallium arsenide (InGaAs); or a combination of aluminum, gallium, or indium with nitride, phosphide, arsenide, or antimony. In some embodiments, the III-V material is deposited by a deposition process comprising alkylsilyl-compounds of As or Sb and/or halides, such as chlorides, of the group 13 elements, like Al, Ga and In. The II-VI material that may be used in the depositing step 220 include: zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telluride (ZnTe), cadmium sulfide (CdS), cadmium telluride (CdTe), and cadmium selenide (CdSe). The IV-VI material that may be used in the depositing step 220 include: tin sulfide (SnS), silicon selenide (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon telluride (SiTe), germanium telluride (GeTe), and tin telluride (SnTe).

Other materials that can potentially be deposited in the depositing step 220 may include germanium (Ge), silicon germanium (SiGe), zinc oxide (ZnO), zinc oxynitride (ZnON), indium gallium zinc oxide (IZGO), indium tin oxide (ITO), titanium oxide (TiOx), carbon nanotubes, graphene, silicon carbide (SiC), germanium tin (GeSn), germanium selenide (GeSe), tin selenide (SnSe), diamond, tungsten sulfide (WS₂), or boron nitride carbide (BNC). The applicability of these above listed materials will depend on the availability of forming processes as well as sufficiently high intrinsic mobility.

The channel layer formed in depositing step 220 may be approximately 10 nm thick. The method also includes a step of filling a remaining opening with a second material 230. The second material in the filling step 230 may include silicon oxides (such as silicon dioxide, hafnium oxides, or aluminum oxides), polysilicon, or other conductive materials. Each of the steps discussed above may be repeated and ordered in different sequences in order to allow formation of a desired channel.

FIG. 3 illustrates one method in accordance with the invention. The method includes a step of providing a substrate with an opening 300. The substrate of the providing step 300 has an opening that may be formed by etching, for example. The opening of the substrate as seen from the top of the substrate in a birds-eye view may have a shape that is circular, square, rectangular, or other shape. The opening of the substrate may then extend into the substrate, resulting in a three-dimensional shape, such as a cylindrical, cuboidal, via-shaped, tapered three-dimensional shape, or other shape. After the providing step 300, additional steps to form or deposit further layers (i.e., the tunnel dielectric, a trapping material and/or a blocking oxide) are performed.

The method includes a step of depositing a first material to form a channel layer 310. The first material may be a compound semiconductor material. Appropriate compound semiconductor materials may include III-V materials, II-VI materials, and IV-VI materials. The depositing step 310 may be accomplished by atomic layer deposition (ALD), resulting in a layer for the channel layer, which in some embodiments is poly-crystalline. ALD may provide the advantage of a highly conformal deposition in high aspect ratio structures, similar to those in V-NAND applications. In other embodiments, CVD or other cyclical deposition processes may be used. The III-V materials that may be used in the depositing step 310 include: gallium arsenide (GaAs); gallium antimonide (GaSb); indium phosphide (InP); gallium nitride (GaN); indium antimonide (InSb); indium gallium arsenide (InGaAs); or a combination of aluminum, gallium, or indium with nitride, phosphide, arsenide, or antimony. In some embodiments, the III-V material is deposited by an ALD process comprising alkylsilyl-compounds of As or Sb and/or halides, such as chlorides, of the group 13 elements, like Al, Ga and In. The II-VI material that may be used in the depositing step 310 include: zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telluride (ZnTe), cadmium sulfide (CdS), cadmium telluride (CdTe), and cadmium selenide (CdSe). The IV-VI material that may be used in the depositing step 310 include: tin sulfide (SnS), silicon selenide (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon telluride (SiTe), germanium telluride (GeTe), and tin telluride (SnTe).

Other materials that can potentially be deposited in the depositing step 310 may include germanium (Ge), silicon germanium (SiGe), zinc oxide (ZnO), zinc oxynitride (ZnON), indium gallium zinc oxide (IZGO), indium tin oxide (ITO), titanium oxide (TiOx), carbon nanotubes, graphene, silicon carbide (SiC), germanium tin (GeSn), germanium selenide (GeSe), tin selenide (SnSe), diamond, tungsten sulfide (WS₂), or boron nitride carbide (BNC). The applicability of these above listed materials will depend on the availability of forming processes as well as sufficiently high intrinsic mobility.

The channel layer formed in depositing step 310 may be approximately 10 nm thick. The method also includes a step of filling a remaining opening with a second material, for example compound semiconductor material, like II-VI or III-V material 320. In some embodiments, the III-V material used in the filling step 320 may likely be different than the III-V material deposited in depositing step 310. In other embodiments, the III-V material used in the filling step 320 may be the same as the III-V material deposited in depositing step 310. Suitability of the material used in the filling step 320 may depend on the conductivity, band gap (either a higher, lower, or approximately same band gap), ability to integrate with dielectrics and/or III-V material of depositing step 310, electron and/or hole mobility, charge carrier density, and electron effective mass of the III-V materials. Each of the steps discussed above may be repeated and ordered in different sequences in order to allow formation of a desired channel.

FIG. 4 illustrates one method in accordance with the invention. The method includes a step of providing a substrate with an opening 400. The substrate of the providing step 400 has an opening that may be formed by etching, for example. The opening of the substrate as seen from the top of the substrate in a birds-eye view may have a shape that is circular, square, rectangular, or other shape. The opening of the substrate may then extend into the substrate, resulting in a three-dimensional shape, such as a cylindrical, cuboidal, via-shaped, or other shape. After the providing step 400, additional steps to form or deposit further layers (i.e., the tunnel dielectric, a trapping material and/or a blocking oxide) are performed.

The method includes a step of pretreating to improve adhesion 410. The step of pretreating 410 may be employed to assist the adhesion of ALD grown compound semiconductor film, such as III-V material, on a dielectric, such as silicon oxide based dielectrics used as a tunnel oxide in V-NAND structure, resulting in greater stability of the formed V-NAND device. In other embodiments, a CVD or other cyclical deposition process may be used. The pretreating step 410 may include a first pulse of a combination of a metal reactant and a non-metal reactant. The pretreating step 410 may then include a second pulse of a metal reactant.

In one embodiment in accordance with the invention, the pretreating step 410 may include several pulses of GaCl₃ and H₂O before starting a deposition of III-V material, such as GaSb, onto a thermal SiO₂ substrate. A pretreating step 410 may include a first pulse of gallium trichloride (GaCl₃) and water. A deposition step 420 may follow, comprising a second pulse of Sb(SiMe₃)₃ and GaCl₃. The first pulse or the second pulse may be repeated as necessary. Typical pulse lengths may range from about 0.05 to 20 seconds, from about 0.1 to 5 seconds, or from about 0.2 to 2 seconds. However, other pulse lengths may be utilized if necessary, such as where highly conformal step coverage over extremely high aspect ratio structures or structures having high surface area or other structures with complex surface morphology is needed or in case of batch reactors. Similarly, typical removal/purge times are from about 0.05 to 20 seconds, from about 0.5 to 10 seconds, or from about 1 to 5 seconds. However, other removal/purge times may be utilized if necessary, such as where highly conformal step coverage over extremely high aspect ratio structures or structures having high surface area or other structures with complex surface morphology is needed or in case of batch reactors.

Substrate Pulsing Scheme Test 20 nm thermal SiO₂ 1*[GaCl₃ and H₂O] and Heavy partial 100*[Sb(SiMe₃)₃ delamination and GaCl₃] 20 nm thermal SiO₂ 2*[GaCl₃ and H₂O] and Partial 100*[Sb(SiMe₃)₃ delamination and GaCl₃] 20 nm thermal SiO₂ 3*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 4*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 5*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 6*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 7*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 8*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 9*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃] 20 nm thermal SiO₂ 10*[GaCl₃ and H₂O] and Pass 100*[Sb(SiMe₃)₃ and GaCl₃]

Chemicals that may be used as a metal reactant for the first pulse of the pretreating step 410 include metal compounds. The metal compounds may include metal-organics or organometallic compounds, such as: metal-organic or organometallic compounds of group 13 or group 15 elements; metal-organic or organometallic compounds of gallium or antimony; or metal halides such as metal chlorides, semi-metal halides, semi-metal chlorides, gallium trichloride (GaCl₃), and other gallium halides. Chemicals that may be used as a non-metal reactant for the second pulse of the pretreating step 410 include oxygen-containing reactants, such as H₂O, H₂O₂, O₃, and plasmas and radicals incorporating oxygen. Other non-metal reactants may include chemicals with a hydroxide group and others. The first and second pulses of the pretreating step 410 may be performed in any order.

In some embodiments, the pretreating step 410 may deposit a material, such as Ga₂O₃, onto the substrate. In some embodiments, the pretreating step 410 may not deposit a substantial amount or a film of material, such as Ga₂O₃, onto the substrate. In some embodiments, the temperature of the pretreating step 410 is from about 20 to about 500° C., from about 40 to about 250° C., from about 50 to about 150° C., or from about 60 to about 130° C. In some embodiments, the temperature of the pretreating step 410 may be substantially the same as the temperature of the depositing step 420. In some embodiments, the temperature of the pretreating step 410 may be within less than a difference of about 100° C., within less than a difference of about 50° C., or within less than a difference of 20° C. from the temperature of the depositing step 420.

The method includes a step of depositing compound semiconductor materials to form a channel layer 420. Appropriate compound semiconductor materials may include III-V materials, II-VI materials, and IV-VI materials. The depositing step 420 may be accomplished by atomic layer deposition (ALD), resulting in a layer for the channel layer, which in some embodiments is poly-crystalline. ALD may provide the advantage of a highly conformal deposition in high aspect ratio structures, similar to those in V-NAND applications. In other embodiments, CVD or other cyclical deposition process may be used. The III-V materials that may be used in the depositing step 420 include: gallium antimonide (GaSb), gallium arsenide (GaAs); indium phosphide (InP); gallium nitride (GaN); indium antimonide (InSb); indium gallium arsenide (InGaAs); or a combination of aluminum, gallium, or indium with nitride, phosphide, arsenide, or antimony. In some embodiments, the III-V material is deposited by an ALD process comprising alkylsilyl-compounds of As or Sb and/or halides, such as chlorides, of the group 13 elements, like Al, Ga and In. The II-VI material that may be used in the depositing step 420 include: zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telluride (ZnTe), cadmium sulfide (CdS), cadmium telluride (CdTe), and cadmium selenide (CdSe). The IV-VI material that may be used in the depositing step 420 include: tin sulfide (SnS), silicon selenide (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon telluride (SiTe), germanium telluride (GeTe), and tin telluride (SnTe).

Other materials that can potentially be deposited in the depositing step 420 may include germanium (Ge), silicon germanium (SiGe), zinc oxide (ZnO), zinc oxynitride (ZnON), indium gallium zinc oxide (IZGO), indium tin oxide (ITO), titanium oxide (TiOx), carbon nanotubes, graphene, silicon carbide (SiC), germanium tin (GeSn), germanium selenide (GeSe), tin selenide (SnSe), diamond, tungsten sulfide (WS₂), or boron nitride carbide (BNC). The applicability of these above listed materials will depend on the availability of forming processes as well as sufficiently high intrinsic mobility.

The channel layer formed in depositing step 420 may be approximately 10 nm thick. The method also includes a step of filling a remaining opening with additional semiconductor material, for example compound semiconductor material, like II-VI, III-V material, or IV-VI material 420. In some embodiments, the III-V material used in the filling step 420 may likely be different than the III-V material deposited in depositing step 410. In other embodiments, the III-V material used in the filling step 420 may be the same as the III-V material deposited in depositing step 410. Suitability of the material used in the filling step 420 may depend on the conductivity, band gap (either a higher, lower, or approximately same band gap), ability to integrate with dielectrics and/or III-V material of depositing step 410, electron and/or hole mobility, charge carrier density, and electron effective mass of the III-V materials. Each of the steps discussed above may be repeated and ordered in different sequences in order to allow formation of a desired channel.

FIG. 5 illustrates one embodiment in accordance with the invention. A method of forming a III-V film may comprise: providing a silicon oxide surface 500; a halide precursor treatment 510; a deposition of an alkyl-silyl compound precursor 520; and a deposition of a metal halide precursor 530.

The silicon oxide surface of step 500 may have hydroxyl (—OH) groups. As a result, the halide precursor of step 510 may convert the hydroxyl groups into Si—Cl bonds. The halide precursor of step 510 may comprise carbon tetrachloride (CCl₄) or trichloromethane (CHCl₃). The halide precursor of step 510 may also comprise a chemistry having a formula of CX₄ or CH_(a)X_(4-a), where X is a halide such as F, Cl, or Br, for example. The halide precursor of step 510 may comprise at least one of: Cl, Cl₂, HCl, radicals, excited species, or plasmas comprising halides, such as chlorine.

The halide precursor pretreatment step 510 may comprise multiple cycles of exposure to the halide precursor, exceeding 10 cycles, 50 cycles, 100 cycles, 150 cycles, 200 cycles, or 250 cycles. The halide precursor pretreatment step 510 may involve exposures ranging between 0.1 and 10 seconds, between 1 and 8 seconds, or between 3 and 7 seconds, for those reactions occurring in a mini-batch or a single wafer reactor. In some embodiments, for example in batch reactors, the exposure and purge and other times may be longer.

The halide precursor pretreatment step 510 may also comprise a pre-stabilization lasting between 2 and 10 minutes. The pre-stabilization comprises waiting in the reactor before deposition of the precursors in steps 520 and 530. The benefits achieved from the pre-stabilization may include complete adhesion of the films and avoidance of any delamination. In addition, the halide precursor pretreatment step may occur at temperatures less than 500° C., less than 450° C., less than 400° C., or less than 350° C.

The alkyl-silyl compound precursor of step 520 may then react with the Si—Cl bonds. The step 520 may require a higher temperature exceeding approximately 100° C. in order to react with the alkyl-silyl compound precursor. The alkyl-silyl compound precursor may comprise alkylsilyl-compounds of As or Sb, such as Sb(SiMe₃)₃, for example. In addition, the alkyl-silyl compound precursor step may occur at temperatures less than 150° C., less than 130° C., less than 115° C., or less than 105° C.

After deposition of the alkyl-silyl compound precursor, a deposition of a metal halide precursor 520 may take place in order to form a III-V material. The metal halide precursor in step 520 may comprise halides, such as chlorides, of the group 13 elements, like Al, Ga and In. An example of the metal halide precursor in step 520 may be gallium trichloride (GaCl₃). The III-V material formed may comprise: gallium antimonide (GaSb); gallium arsenide (GaAs); indium phosphide (InP); gallium nitride (GaN); indium antimonide (InSb); indium gallium arsenide (InGaAs); or a combination of aluminum, gallium, or indium with nitride, phosphide, arsenide, or antimony. In addition, the metal halide precursor step may occur at temperatures less than 150° C., less than 130° C., less than 115° C., or less than 105° C.

In some embodiments, a deposited compound semiconductor material may have a conformality greater than about 50%, greater than about 80%, greater than about 90%, greater than about 95%, greater than about 98%, or greater than about 99%. The deposited compound semiconductor material may have an aspect ratios (depth:width) of more than about 2, more than about 5, more than about 10, more than about 20, or in some instances even more than about 40, or more than about 80. It may be noted that aspect ratio may be difficult to determine for the V-NAND structures, but in this context, the aspect ratio could be understood to be the ratio of the total surface area of the structures in the wafer (or part of the wafer) in relation to the planar surface area of wafer (or part of the wafer).

In some embodiments, the reaction temperature for the deposition of the compound semiconductor material film (such as III-V material, like GaSb or GaAs, II-VI material, or a IV-VI material) may be less than about 700° C., may be less than about 500° C., less than about 400° C., less than about 300° C., less than about 200° C., or less than about 150° C.

In some embodiments, the growth rate of the deposited compound semiconductor materials may be less than about 3 Å/cycle, less than about 2 Å/cycle, less than about 1.5 Å/cycle, or less than about 1 Å/cycle. In some embodiments, the growth rate of the deposited compound semiconductor materials may range from about 0.05 Å/cycle to about 2 Å/cycle, or about 0.1 Å/cycle to about 1.5 Å/cycle.

FIG. 6 illustrates a structure 600 that can be formed in accordance with at least one embodiment of the disclosure. In the illustrated example, structure 600 includes a substrate 610 having an opening 602 therein. Structure 600 further includes a first material 606 comprising a compound semiconductor material or other first material described herein and a second material 608 filling a remaining portion of opening 602. As noted above, substrate 610 can include a surface 604 that can include dielectric material.

In some embodiments, the compound semiconductor material may have impurities (i.e., other than materials in the compound semiconductor material itself) of less than about 20 at-%, less than about 10 at-%, less than about 5 at-%, or less than about 3 at-%. In some embodiments, the compound semiconductor materials may have halide impurities, such as chlorine, of less than about 5 at-%, less than about 2 at-%, less than about 1 at-%, or less than about 0.5 at-%. In some embodiments, the compound semiconductor materials may have hydrogen impurities of less than about 25 at-%, less than about 15 at-%, less than about 10 at-%, or less than about 5 at-%. In some embodiments, the compound semiconductor material may have silicon impurities of less than about 5 at-%, less than about 2 at-%, less than about 1 at-%, or less than about 0.5 at-%. In some embodiments, the compound semiconductor materials has carbon impurities, less than about 5 at-%, less than about 2 at-%, less than about 1 at-%, or less than about 0.5 at-%.

The examples set forth below are illustrative of various aspects of certain embodiments of the disclosure. The methods and various parameters reflected therein are intended only to exemplify various aspects and embodiments of the disclosure, and are not intended to limit the scope of the claimed invention.

-   -   1. A method of forming a channel for use in a V-NAND device         comprising:         -   providing a substrate, the substrate having an opening;         -   depositing a first material by atomic layer deposition in             the opening to form a channel layer; and         -   filling a remaining portion of the opening with a second             material.     -   2. The method of example 1, wherein the surface of the opening         comprises the second material.     -   3. The method of example 2, wherein the second material         comprises at least one of: a conductive material; a         semiconductive material; a dielectric material; or a silicon         oxide.     -   4. The method of example 1, wherein the first material is a         compound semiconductor.     -   5. The method of example 1, wherein the first material comprises         at least one of: gallium antimonide (GaSb); gallium arsenide         (GaAs); indium phosphide (InP); gallium nitride (GaN); indium         antimonide (InSb); indium gallium arsenide (InGaAs); or a         combination of aluminum, gallium, or indium with nitride,         phosphide, arsenide, or antimony.     -   6. The method of example 1, wherein the first material is         deposited by ALD process comprising alkylsilyl-compounds of         antimony or arsenic.     -   7. The method of example 1, wherein the first material is         deposited by ALD process comprising chloride of Al, Ga, or In.     -   8. The method of example 1, wherein the first material comprises         at least one of: germanium (Ge), silicon germanium (SiGe), zinc         oxide (ZnO), zinc oxynitride (ZnON), indium gallium zinc oxide         (IZGO), indium tin oxide (ITO), titanium oxide (TiOx), cadmium         telluride (CdTe), zinc sulfide (ZnS), carbon nanotubes,         graphene, silicon carbide (SiC), germanium tin (GeSn), germanium         selenide (GeSe), tin selenide (SnSe), diamond, tungsten sulfide         (WS₂), tin sulfide (SnS), silicon selenide (SiSe), germanium         selenide (GeSe), tin selenide (SnSe), silicon telluride (SiTe),         germanium telluride (GeTe), tin telluride (SnTe), or boron         nitride carbide (BNC).     -   9. A method for forming a structure comprising:         -   providing a substrate having a surface comprising an oxide;         -   performing a pretreatment to the oxide surface; and         -   depositing a semiconductor material on the oxide surface             after the pretreatment;         -   wherein the pretreatment comprises a gallium compound and             oxygen compound.     -   10. The method of example 9, wherein the semiconductor material         is a compound semiconductor deposited through one of: atomic         layer deposition, chemical vapor deposition, or cyclical         deposition.     -   11. The method of example 9, wherein the gallium compound is         gallium chloride and the oxygen compound is water.     -   12. The method of example 9, wherein the gallium compound and         oxygen compound is applied to surface periodically and/or         alternatively.     -   13. The method of example 9, wherein the gallium compound and         oxygen compound is applied to surface in cyclical manner.     -   14. A method of forming a channel for use in a V-NAND device         comprising:         -   providing a substrate, the substrate having an opening;         -   pretreating a surface formed in the opening;         -   depositing a first material inside the opening to form a             channel layer; and         -   filling a remaining portion of the opening with a second             material.     -   15. The method of example 14, wherein the substrate comprises at         least a silicon oxide.     -   16. The method of example 14, wherein the second material         comprises at least one of: a conductive material; a         semiconductive material; a dielectric material; or a silicon         oxide.     -   17. The method of example 14, wherein the pretreating step         comprises cycles of at least one of: gallium trichloride         (GaCl₃), and water (H₂O).     -   18. The method of example 14, wherein the first material         comprises a compound semiconductor material deposited via at         least one of: atomic layer deposition, chemical vapor         deposition, or cyclical deposition.     -   19. The method of example 14, wherein the first material         comprises at least one of: gallium antimonide (GaSb), gallium         arsenide (GaAs); indium phosphide (InP); gallium nitride (GaN);         indium antimonide (InSb); indium gallium arsenide (InGaAs); or a         combination of aluminum, gallium, or indium with nitride,         phosphide, arsenide, or antimony.     -   20. The method of example 14, wherein the first material         comprises at least one of: germanium (Ge), silicon germanium         (SiGe), zinc oxide (ZnO), zinc oxynitride (ZnON), indium gallium         zinc oxide (IZGO), indium tin oxide (ITO), titanium oxide         (TiOx), cadmium telluride (CdTe), zinc sulfide (ZnS), carbon         nanotubes, graphene, silicon carbide (SiC), germanium tin         (GeSn), germanium selenide (GeSe), tin selenide (SnSe), diamond,         tungsten sulfide (WS₂), tin sulfide (SnS), silicon selenide         (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon         telluride (SiTe), germanium telluride (GeTe), tin telluride         (SnTe), or boron nitride carbide (BNC).     -   21. A method of forming a channel for use in a V-NAND device         comprising:         -   providing a substrate, the substrate having an opening;         -   depositing a first material in the opening to form a channel             layer; and         -   filling a remaining portion of the opening with a second             material, wherein the second material comprises at least one             of a conductive material or a semiconductive material.     -   22. The method of example 21, wherein the surface of the opening         comprises dielectric material.     -   23. The method of example 21, wherein the first material is a         compound semiconductor deposited via at least one of: atomic         layer deposition, chemical vapor deposition, or cyclical         deposition.     -   24. The method of example 21, wherein the first material         comprises at least one of: gallium antimonide (GaSb), gallium         arsenide (GaAs); indium phosphide (InP); gallium nitride (GaN);         indium antimonide (InSb); indium gallium arsenide (InGaAs); or a         combination of aluminum, gallium, or indium with nitride,         phosphide, arsenide, or antimony.     -   25. The method of example 21, wherein the first material         comprises at least one of: germanium (Ge), silicon germanium         (SiGe), zinc oxide (ZnO), zinc oxynitride (ZnON), indium gallium         zinc oxide (IZGO), indium tin oxide (ITO), titanium oxide         (TiOx), cadmium telluride (CdTe), zinc sulfide (ZnS), carbon         nanotubes, graphene, silicon carbide (SiC), germanium tin         (GeSn), germanium selenide (GeSe), tin selenide (SnSe), diamond,         tungsten sulfide (WS₂), tin sulfide (SnS), silicon selenide         (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon         telluride (SiTe), germanium telluride (GeTe), tin telluride         (SnTe), or boron nitride carbide (BNC).     -   26. The method of example 21, wherein the second material         comprises at least one of: gallium antimonide (GaSb), gallium         arsenide (GaAs); indium phosphide (InP); gallium nitride (GaN);         indium antimonide (InSb); indium gallium arsenide (InGaAs); or a         combination of aluminum, gallium, or indium with nitride,         phosphide, arsenide, or antimony.     -   27. The method of example 21, wherein the second material         comprises at least one of: germanium (Ge), silicon germanium         (SiGe), zinc oxide (ZnO), zinc oxynitride (ZnON), indium gallium         zinc oxide (IZGO), indium tin oxide (ITO), titanium oxide         (TiOx), cadmium telluride (CdTe), zinc sulfide (ZnS), carbon         nanotubes, graphene, silicon carbide (SiC), germanium tin         (GeSn), germanium selenide (GeSe), tin selenide (SnSe), diamond,         tungsten sulfide (WS₂), tin sulfide (SnS), silicon selenide         (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon         telluride (SiTe), germanium telluride (GeTe), tin telluride         (SnTe), or boron nitride carbide (BNC).     -   28. A method of forming a channel for use in a V-NAND device         comprising:         -   providing a substrate, the substrate having an opening;         -   pretreating surfaces formed in the opening;         -   depositing a first material inside the opening to form a             channel layer; and         -   filling a remaining portion of the opening with a second             material.     -   29. The method of example 28, wherein the surface of the opening         comprises the second material.     -   30. The method of example 28, wherein the pretreating step         comprises cycles of gallium trichloride (GaCl₃), and water         (H₂O).     -   31. The method of example 28, wherein the first material is a         compound semiconductor formed via at least one of: atomic layer         deposition, chemical vapor deposition, or cyclical deposition.     -   32. The method of example 28, wherein the first material         comprises at least one of: gallium antimonide (GaSb); gallium         arsenide (GaAs); indium phosphide (InP); gallium nitride (GaN);         indium antimonide (InSb); or a combination of aluminum, gallium,         or indium with nitride, phosphide, arsenide, or antimony.     -   33. The method of example 28, wherein the first material         comprises at least one of: germanium (Ge), silicon germanium         (SiGe), zinc oxide (ZnO), zinc oxynitride (ZnON), indium gallium         zinc oxide (IZGO), indium tin oxide (ITO), titanium oxide         (TiOx), cadmium telluride (CdTe), zinc sulfide (ZnS), carbon         nanotubes, graphene, silicon carbide (SiC), germanium tin         (GeSn), germanium selenide (GeSe), tin selenide (SnSe), diamond,         tungsten sulfide (WS₂), tin sulfide (SnS), silicon selenide         (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon         telluride (SiTe), germanium telluride (GeTe), tin telluride         (SnTe), or boron nitride carbide (BNC).     -   34. The method of example 28, wherein the second material is at         least one of: a conductive material; a semiconductive material;         a dielectric material; or a silicon oxide.     -   35. The method of example 28, wherein the second material         comprises at least one of: gallium antimonide (GaSb); gallium         arsenide (GaAs); indium phosphide (InP); gallium nitride (GaN);         indium antimonide (InSb); indium gallium arsenide (InGaAs); or a         combination of aluminum, gallium, or indium with nitride,         phosphide, arsenide, or antimony.     -   36. The method of example 28, wherein the second material         comprises at least one of: germanium (Ge), silicon germanium         (SiGe), zinc oxide (ZnO), zinc oxynitride (ZnON), indium gallium         zinc oxide (IZGO), indium tin oxide (ITO), titanium oxide         (TiOx), cadmium telluride (CdTe), zinc sulfide (ZnS), carbon         nanotubes, graphene, silicon carbide (SiC), germanium tin         (GeSn), germanium selenide (GeSe), tin selenide (SnSe), diamond,         tungsten sulfide (WS₂), tin sulfide (SnS), silicon selenide         (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon         telluride (SiTe), germanium telluride (GeTe), tin telluride         (SnTe), or boron nitride carbide (BNC).     -   37. A method of performing pretreatment prior to depositing a         channel for use in a V-NAND device comprising:         -   performing a cyclic pretreatment process comprising a pulse             of a first metal reactant and a pulse of non-metal reactant;             and         -   performing a second pulse comprising a second metal reactant             within an opening in which a channel is to be deposited;         -   wherein the cyclic pretreatment process improves adhesion of             a material to be deposited in the opening.     -   38. The method of example 37, wherein the first metal reactant         of the first pulse comprises at least one of: metal compounds;         metal-organics or organometallic compounds; metal-organic or         organometallic compounds of group 13 or group 15 elements;         metal-organic or organometallic compounds of gallium or         antimony; metal halides; metal chlorides; semi-metal halides;         semi-metal chlorides; gallium trichloride (GaCl₃); or other         gallium halides.     -   39. The method of example 37, wherein the non-metal reactant of         the first pulse comprises at least one of: H₂O, H₂O₂, O₃,         plasmas and radicals incorporating oxygen, or chemicals with a         hydroxide group.     -   40. The method of example 37, wherein the second metal reactant         of the second pulse comprises at least one of: indium chloride,         gallium trichloride (GaCl₃), Sb(SiMe₃)₃, or alkylsilyl compounds         of antimony or arsenic.     -   41. A method of forming a film for use in a V-NAND device         comprising:         -   performing a cyclic pretreatment process comprising pulse of             a first halide reactant onto a silicon oxide surface;         -   pulsing an alkyl-silyl compound precursor; and         -   pulsing a metal halide precursor;         -   wherein a reaction of the alkyl-silyl compound precursor and             the metal halide precursor forms a III-V film.     -   42. The method of example 41, wherein the III-V film comprises:         gallium antimonide (GaSb); gallium arsenide (GaAs); indium         phosphide (InP); gallium nitride (GaN); indium antimonide         (InSb); indium gallium arsenide (InGaAs); or a combination of         aluminum, gallium, or indium with nitride, phosphide, arsenide,         or antimony.     -   43. The method of example 41, wherein the alkyl-silyl compound         precursor comprises alkylsilyl-compounds of As or Sb, or         Sb(SiMe₃)₃.     -   44. The method of example 41, wherein the first halide precursor         comprises at least one of: carbon tetrachloride (CCl₄);         trichloromethane (CHCl₃); chloride (Cl); chlorine (Cl₂);         radicals, excited species, or plasmas comprising halides; or a         chemistry having a formula of CX₄ or CH_(a)X_(4-a), where X is a         halide such as F, Cl, or Br.     -   45. The method of example 41, wherein the cyclic pretreatment         process occurs at a temperature less than 700° C., less than         500° C., less than 450° C., less than 400° C., or less than 350°         C.     -   46. The method of example 41, wherein the cyclic pretreatment         process comprises multiple cycles of exposure to the first         halide precursor exceeding 10 cycles, 50 cycles, 100 cycles, 150         cycles, 200 cycles, or 250 cycles.     -   47. The method of example 41 wherein the cyclic pretreatment         process comprises exposure of the first halide precursor having         a duration ranging between 0.1 and 10 seconds, between 1 and 8         seconds, or between 3 and 7 seconds.     -   48. The method of example 41, wherein pulsing the alkyl-silyl         compound precursor and pulsing the metal halide precursor occur         at a temperature less than 150° C., less than 130° C., less than         115° C., or less than 105° C.     -   49. A method for forming a structure comprising:         -   providing a substrate having a surface comprising an oxide;         -   performing a pretreatment to the oxide surface; and         -   depositing a compound semiconductor material on the oxide             surface after the pretreatment;         -   wherein the pretreatment comprises a halide.     -   50. The method of example 49, wherein the pretreatment improves         adhesion of the compound semiconductor material to the         substrate.

The particular implementations shown and described are illustrative of the invention and its best mode and are not intended to otherwise limit the scope of the aspects and implementations in any way. Indeed, for the sake of brevity, conventional manufacturing, connection, preparation, and other functional aspects of the system may not be described in detail. Furthermore, the connecting lines shown in the various figures are intended to represent exemplary functional relationships and/or physical couplings between the various elements. Many alternative or additional functional relationship or physical connections may be present in the practical system, and/or may be absent in some embodiments.

It is to be understood that the configurations and/or approaches described herein are exemplary in nature, and that these specific embodiments or examples are not to be considered in a limiting sense, because numerous variations are possible. The specific routines or methods described herein may represent one or more of any number of processing strategies. Thus, the various acts illustrated may be performed in the sequence illustrated, in other sequences, or omitted in some cases.

The subject matter of the present disclosure includes all novel and nonobvious combinations and subcombinations of the various processes, systems, and configurations, and other features, functions, acts, and/or properties disclosed herein, as well as any and all equivalents thereof. 

We claim:
 1. A method of forming a channel layer for use in a V-NAND device comprising: providing a substrate, the substrate having an opening comprising a surface in the opening; pretreating the surface using a cyclic pretreatment comprising a first pulse and a second pulse, wherein the first pulse comprises a combination of a metal reactant and a non-metal reactant; after the pretreating, depositing, using atomic layer deposition or cyclic chemical vapor deposition, a first material inside the opening; pre-stabilizing the substrate, wherein the pre-stabilizing comprises waiting a period of time after completion of the pretreating before commencing the depositing, wherein the period of time is between 2 minutes and 10 minutes; and filling a remaining portion of the opening with a second material.
 2. The method of claim 1, wherein the second pulse comprises the metal reactant.
 3. The method of claim 1, wherein the metal reactant of the first pulse comprises gallium trichloride (GaCl₃).
 4. The method of claim 1, wherein the first material comprises at least one of: gallium antimonide (GaSb), gallium arsenide (GaAs); gallium nitride (GaN); indium antimonide (InSb); indium gallium arsenide (InGaAs); or a combination of aluminum, gallium, or indium with nitride, phosphide, arsenide or antimony.
 5. The method of claim 1, wherein the first material comprises at least one of: germanium (Ge), silicon germanium (SiGe), zinc oxynitride (ZnON), indium tin oxide (ITO), titanium oxide (TiOx), cadmium telluride (CdTe), zinc sulfide (ZnS), carbon nanotubes, graphene, silicon carbide (SiC), germanium tin (GeSn), germanium selenide (GeSe), tin selenide (SnSe), diamond, tungsten sulfide (WS₂), tin sulfide (SnS), silicon selenide (SiSe), germanium selenide (GeSe), tin selenide (SnSe), silicon telluride (SiTe), germanium telluride (GeTe), tin telluride (SnTe), or boron nitride carbide (BNC).
 6. The method of claim 1, wherein the first material comprises at least one of: zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telluride (ZnTe), cadmium sulfide (CdS), cadmium telluride (CdTe), and cadmium selenide (CdSe). 